The
analyzer is explosion protected in compliance with
TIIS Ex pd IIB T4. The measurement system is based
around a high performance semiconductor X-ray sensor
Si(PIN) photodiode. This sensor provides a high
S/N ratio together with excellent stability. The
X-ray sensor has been specially designed for this
application and its compact size means that there
are no special RI regulations applicable to its
operation.
One
of the highest design priorities was for the instrument
to require reduced and simplified maintenance procedures.
This instrument is so stable it can operate correctly
for up to one year between calibrations.
The
analytical cell features a Beryllium (Be) film window.
Traditionally the Be window has been the weakest
part if this type of analyzer. However, the improved
design of this analytical cell enables the Be window
to withstand up to 1MPa pressures and also offer
excellent chemical resistance. These features extend
the life of the Be window to typically 4 years.
The
analyzer also features a wide dynamic range and
can cope with measurements from 0~0.1 w t % up to
0~5 wt %.
